Authors: Chen, H. Y.
Gao, H. J.
Hou, S. M.
Sohlberg, K.
Xue, Z. Q.
Title: Reply: Gao et al.
Language (ISO): en
URI: http://hdl.handle.net/2003/1436
http://dx.doi.org/10.17877/DE290R-11246
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 17

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