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dc.contributor.authorFisher, A. J.de
dc.contributor.authorGrütter, P.de
dc.contributor.authorHofer, W. A.de
dc.contributor.authorWolkow, R. A.de
dc.date.accessioned2004-12-03T15:23:03Z-
dc.date.available2004-12-03T15:23:03Z-
dc.date.created2001de
dc.date.issued2001de
dc.identifier.urihttp://hdl.handle.net/2003/1791-
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-11512-
dc.format.extent103780 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoende
dc.publisherThe American Physical Societyde
dc.relation.ispartofseriesPhysical Review Lettersde
dc.subject.ddc530de
dc.titleSurface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopyen
dc.typeTextde
dc.identifier.doi10.1103/PhysRevLett.87.236104de
dc.type.publicationtypearticlede
dcterms.accessRightsrestricted-
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