Authors: Jarvis, M. R.
Payne, M. C.
Pérez, Rubén
Title: Can Atomic Force Microscopy Achieve Atomic Resolution in Contact Mode?
Language (ISO): en
URI: http://hdl.handle.net/2003/18348
http://dx.doi.org/10.17877/DE290R-12493
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 07

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