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Resources for and from Research, Teaching and Studying
Resources for and from Research, Teaching and Studying
| Authors: | Jarvis, M. R. Payne, M. C. Pérez, Rubén |
| Title: | Can Atomic Force Microscopy Achieve Atomic Resolution in Contact Mode? |
| Language (ISO): | en |
| URI: | http://hdl.handle.net/2003/18348 http://dx.doi.org/10.17877/DE290R-12493 |
| Issue Date: | 2001 |
| Provenance: | The American Physical Society |
| Appears in Collections: | Issue 07 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 1287_1.pdf Restricted Access | 357.12 kB | Adobe PDF | View/Open |
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