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| Authors: | Barth, C. Foster, A. S. Reichling, M. Shluger, A. L. |
| Title: | Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator |
| Language (ISO): | en |
| URI: | http://hdl.handle.net/2003/18639 http://dx.doi.org/10.17877/DE290R-12613 |
| Issue Date: | 2001 |
| Provenance: | The American Physical Society |
| Appears in Collections: | Issue 11 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2373_1.pdf Restricted Access | 888.01 kB | Adobe PDF | View/Open |
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