Authors: Barth, C.
Foster, A. S.
Reichling, M.
Shluger, A. L.
Title: Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator
Language (ISO): en
URI: http://hdl.handle.net/2003/18639
http://dx.doi.org/10.17877/DE290R-12613
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 11

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