E[prime] Centers in Amorphous SiO2 Revisited: A New Look at an Old Problem

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DC Field	Value	Language
dc.contributor.author	Takahashi, M.	de
dc.contributor.author	Uchino, T.	de
dc.contributor.author	Yoko, T.	de
dc.date.accessioned	2004-12-14T14:11:27Z	-
dc.date.available	2004-12-14T14:11:27Z	-
dc.date.created	2001	de
dc.date.issued	2001	de
dc.identifier.uri	http://hdl.handle.net/2003/18816	-
dc.identifier.uri	http://dx.doi.org/10.17877/DE290R-12637	-
dc.format.extent	130759 bytes	-
dc.format.mimetype	application/pdf	-
dc.language.iso	en	de
dc.publisher	The American Physical Society	de
dc.relation.ispartofseries	Physical Review Letters	de
dc.subject.ddc	530	de
dc.title	E[prime] Centers in Amorphous SiO2 Revisited: A New Look at an Old Problem	en
dc.type	Text	de
dc.identifier.doi	10.1103/PhysRevLett.86.5522	de
dc.type.publicationtype	article	de
dcterms.accessRights	restricted	-
Appears in Collections:	Issue 24

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