Authors: Dreiner, S.
Schürmann, M.
Westphal, C.
Zacharias, H.
Title: Local Atomic Environment of Si Suboxides at the SiO2/Si(111) Interface Determined by Angle-Scanned Photoelectron Diffraction
Language (ISO): en
URI: http://hdl.handle.net/2003/19610
http://dx.doi.org/10.17877/DE290R-2307
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 18

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