Full metadata record
DC FieldValueLanguage
dc.contributor.authorCampbell , C. T.de
dc.contributor.authorLarsen, J. H.de
dc.contributor.authorMusgrove, J. E.de
dc.contributor.authorRanney, J. T.de
dc.contributor.authorStarr, D. E.de
dc.date.accessioned2004-12-03T14:35:46Z-
dc.date.available2004-12-03T14:35:46Z-
dc.date.created2001de
dc.date.issued2001de
dc.identifier.urihttp://hdl.handle.net/2003/968-
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-10792-
dc.format.extent83494 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoende
dc.publisherThe American Physical Societyde
dc.relation.ispartofseriesPhysical Review Lettersde
dc.subject.ddc530de
dc.titleMeasurement of the Energetics of Metal Film Growth on a Semiconductor: Ag/Si(100)-(2×1)en
dc.typeTextde
dc.identifier.doi10.1103/PhysRevLett.87.106102de
dc.type.publicationtypearticlede
dcterms.accessRightsrestricted-
Appears in Collections:Issue 10

Files in This Item:
File Description SizeFormat 
106102_1.pdf
  Restricted Access
81.54 kBAdobe PDFView/Open


This item is protected by original copyright



Items in Eldorado are protected by copyright, with all rights reserved, unless otherwise indicated.