Authors: Ding, Y.
Heying, B.
Im, H.-J.
Pelz, J. P.
Speck, J. S.
Title: Characterization of Individual Threading Dislocations in GaN Using Ballistic Electron Emission Microscopy
Language (ISO): en
URI: http://hdl.handle.net/2003/974
http://dx.doi.org/10.17877/DE290R-6413
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 10

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