Barth, C.Foster, A. S.Reichling, M.Shluger, A. L.2004-12-142004-12-1420012001http://hdl.handle.net/2003/1863910.17877/DE290R-12613enThe American Physical SocietyPhysical Review Letters530Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator10.1103/PhysRevLett.86.2373article (journal)