Jarvis, M. R.Payne, M. C.Pérez, Rubén2004-12-102004-12-1020012001http://hdl.handle.net/2003/1834810.17877/DE290R-12493enThe American Physical SocietyPhysical Review Letters530Can Atomic Force Microscopy Achieve Atomic Resolution in Contact Mode?10.1103/PhysRevLett.86.1287article (journal)