Surface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopy

Fisher, A. J.Grütter, P.Hofer, W. A.Wolkow, R. A.2004-12-032004-12-0320012001http://hdl.handle.net/2003/179110.17877/DE290R-11512enThe American Physical SocietyPhysical Review Letters530Surface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopy10.1103/PhysRevLett.87.236104article (journal)