Local Atomic Environment of Si Suboxides at the SiO2/Si(111) Interface Determined by Angle-Scanned Photoelectron Diffraction

Dreiner, S.Schürmann, M.Westphal, C.Zacharias, H.2004-12-272004-12-2720012001http://hdl.handle.net/2003/1961010.17877/DE290R-2307enThe American Physical SocietyPhysical Review Letters530Local Atomic Environment of Si Suboxides at the SiO2/Si(111) Interface Determined by Angle-Scanned Photoelectron Diffraction10.1103/PhysRevLett.86.4068article (journal)