Arzt, E.Dekker, J. P.Gumbsch, P.Volkert, C. A.2004-12-032004-12-0320012001http://hdl.handle.net/2003/55110.17877/DE290R-10332enThe American Physical SocietyPhysical Review Letters530Alloying Effects on Electromigration Mass Transport10.1103/PhysRevLett.87.035901article (journal)