Confinement-Enhanced Electron Transport across a Metal-Semiconductor Interface

Altfeder, I. B.Golovchenko, J. A.Narayanamurti, V.2004-12-032004-12-0320012001http://hdl.handle.net/2003/68510.17877/DE290R-3594enThe American Physical SocietyPhysical Review Letters530Confinement-Enhanced Electron Transport across a Metal-Semiconductor Interface10.1103/PhysRevLett.87.056801article (journal)