Krasel, Olaf2004-12-062004-12-062004-07-292004-08-10http://hdl.handle.net/2003/235410.17877/DE290R-14839enUniversität Dortmundsilicon detectorradiation damagepixel detectortransient current techniqueLHCATLASRD50530Charge collection in irradiated silicon detectorsa study of the operation conditions of silicon sensors in the ATLAS pixel detectordoctoral thesis