Characterisation of ionisation induced surface effects for the optimisation of silicon detectors for particle physics applications

Wüstenfeld, Jens2004-12-062004-12-062001-07-132001-11-12http://hdl.handle.net/2003/235110.17877/DE290R-652enUniversität Dortmundsilicondetectorsilicon radiation detectorradiation damageSurface damageSiliziumStrahlenschädenDetektor530Characterisation of ionisation induced surface effects for the optimisation of silicon detectors for particle physics applicationsdoctoral thesis