Chang, K. J.Jin, Young-Gu2004-12-102004-12-1020012001http://hdl.handle.net/2003/1848910.17877/DE290R-16134enThe American Physical SocietyPhysical Review Letters530Mechanism for the Enhanced Diffusion of Charged Oxygen Ions in SiO210.1103/PhysRevLett.86.1793article (journal)