Mechanism of Interconversion among Radiation-Induced Defects in Amorphous Silicon Dioxide

Takahashi, MasahideUchino, TakashiYoko, Toshinobu2004-12-102004-12-1020012001http://hdl.handle.net/2003/1848510.17877/DE290R-16127enThe American Physical SocietyPhysical Review Letters530Mechanism of Interconversion among Radiation-Induced Defects in Amorphous Silicon Dioxide10.1103/PhysRevLett.86.1777article (journal)