Bischoff, M. M. J.Quinn, A. J.Yamada, T.van Kempen, H.van der Kraan, R. G. P.2004-12-032004-12-0320012001http://hdl.handle.net/2003/184910.17877/DE290R-4624enThe American Physical SocietyPhysical Review Letters530Direct Observation of Surface Alloying and Interface Roughening10.1103/PhysRevLett.87.246102article (journal)