Ding, Y.Heying, B.Im, H.-J.Pelz, J. P.Speck, J. S.2004-12-032004-12-0320012001http://hdl.handle.net/2003/97410.17877/DE290R-6413enThe American Physical SocietyPhysical Review Letters530Characterization of Individual Threading Dislocations in GaN Using Ballistic Electron Emission Microscopy10.1103/PhysRevLett.87.106802article (journal)