Aballe, L.Gokhale, S.Horn, K.Kratzer, P.Rogero, C.2004-12-032004-12-0320012001http://hdl.handle.net/2003/127810.17877/DE290R-11081enThe American Physical SocietyPhysical Review Letters530Probing Interface Electronic Structure with Overlayer Quantum-Well Resonances: Al/Si(111)10.1103/PhysRevLett.87.156801article (journal)