Mayr, S. G.Samwer, K.2004-12-032004-12-0320012001http://hdl.handle.net/2003/55610.17877/DE290R-10337enThe American Physical SocietyPhysical Review Letters530Model for Intrinsic Stress Formation in Amorphous Thin Films10.1103/PhysRevLett.87.036105article (journal)