Kunert, J.Martin, R. J.2004-12-062004-12-061998http://hdl.handle.net/2003/487410.17877/DE290R-5409We show that binary designs for cross-over models obtained from orthogonal arrays are universally optimal under correlated errors.enUniversitätsbibliothek Dortmundcarry-over effectchange-over designcross-over designdependent observationsgeneralized least-squaresoptimal designorthogonal arraysrepeated measurements design310Optimality of Type I Orthogonal Arrays for Cross-over Models with Correlated Errorsreport