Asao, TakayukiTakeuchi, ShinTamura, Ryuji2004-12-272004-12-2720012001http://hdl.handle.net/2003/1934510.17877/DE290R-6992enThe American Physical SocietyPhysical Review Letters530Composition-Dependent Electrical Resistivity in an Al-Re-Si 1/1-Cubic Approximant Phase10.1103/PhysRevLett.86.3104article (journal)