Jeong, SukminOshiyama, Atsushi2004-12-272004-12-2720012001http://hdl.handle.net/2003/1953610.17877/DE290R-12402enThe American Physical SocietyPhysical Review Letters530Atomic and Electronic Structures of N-Incorporated Si Oxides10.1103/PhysRevLett.86.3574article (journal)