Authors: Fleetwood, D. M.
Pantelides, S. T.
Rashkeev, S. N.
Schrimpf, R. D.
Title: Defect Generation by Hydrogen at the Si-SiO2 Interface
Language (ISO): en
URI: http://hdl.handle.net/2003/1319
http://dx.doi.org/10.17877/DE290R-11114
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 16

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