Authors: Takahashi, Masahide
Uchino, Takashi
Yoko, Toshinobu
Title: Mechanism of Interconversion among Radiation-Induced Defects in Amorphous Silicon Dioxide
Language (ISO): en
URI: http://hdl.handle.net/2003/18485
http://dx.doi.org/10.17877/DE290R-16127
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 09

Files in This Item:
File Description SizeFormat 
1777_1.pdf
  Restricted Access
107.69 kBAdobe PDFView/Open


This item is protected by original copyright



All resources in the repository are protected by copyright.