1. Eldorado
  2. Universitätsbibliothek
  3. Sonstige Volltexte aus dem Bibliotheksangebot
  4. Physical Review Letters
  5. Volume 86
  6. Issue 09
Authors: Takahashi, Masahide
Uchino, Takashi
Yoko, Toshinobu
Title: Mechanism of Interconversion among Radiation-Induced Defects in Amorphous Silicon Dioxide
Language (ISO): en
URI: http://hdl.handle.net/2003/18485
http://dx.doi.org/10.17877/DE290R-16127
Issue Date: 2001
Publisher: The American Physical Society
Appears in Collections:Issue 09

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