Ladungsträgerverlust in strahlengeschädigten Siliziumsensoren
dc.contributor.advisor | Gößling, C. | |
dc.contributor.author | Weber, Jens | |
dc.contributor.referee | Rhode, W. | |
dc.date.accepted | 2008-03-14 | |
dc.date.accessioned | 2008-04-15T11:53:01Z | |
dc.date.available | 2008-04-15T11:53:01Z | |
dc.date.issued | 2008-04-15T11:53:01Z | |
dc.identifier.uri | http://hdl.handle.net/2003/25185 | |
dc.identifier.uri | http://dx.doi.org/10.17877/DE290R-66 | |
dc.identifier.urn | urn:nbn:de:hbz:290-2003/25185-2 | |
dc.language.iso | de | de |
dc.subject | Strahlenschaden | de |
dc.subject | Trapping | de |
dc.subject | ATLAS | de |
dc.subject | Pixelsensor | de |
dc.subject | Teilchendetektor | de |
dc.subject.ddc | 530 | |
dc.title | Ladungsträgerverlust in strahlengeschädigten Siliziumsensoren | de |
dc.type | Text | de |
dc.type.publicationtype | doctoralThesis | de |
dcterms.accessRights | open access |