Zuverlässigkeit von sub-µm-CMOS-Schaltungen bei Bias-Temperature-Stress (BTS)

dc.contributor.advisor	Goser, Karl
dc.contributor.author	Schlünder, Christian
dc.contributor.referee	Oehm, Jürgen
dc.date.accepted	2006-09-12
dc.date.accessioned	2007-03-21T13:18:28Z
dc.date.available	2007-03-21T13:18:28Z
dc.date.issued	2007-03-21T13:18:28Z
dc.identifier.uri	http://hdl.handle.net/2003/24191
dc.identifier.uri	http://dx.doi.org/10.17877/DE290R-8410
dc.identifier.urn	urn:nbn:de:hbz:290-2003/24191-8
dc.language.iso	de	de
dc.subject	Zuverlässigkeit	de
dc.subject	Bias Temperature Stress	en
dc.subject	BTS	de
dc.subject	NBTI	de
dc.subject	Degradation	en
dc.subject	MOSFET	de
dc.subject.ddc	620
dc.title	Zuverlässigkeit von sub-µm-CMOS-Schaltungen bei Bias-Temperature-Stress (BTS)	de
dc.type	Text	de
dc.type.publicationtype	doctoralThesis	de
dcterms.accessRights	open access

Files

Now showing 1 - 2 of 2

Now showing 1 - 1 of 1