Wide-field surface plasmon resonance microscope based on polyethylene oxide/polyacrylic acid brushes

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dc.contributor.authorAl-Bataineh, Qais M.
dc.contributor.authorHergenröder, Roland
dc.contributor.authorTelfah, Ahmad D.
dc.contributor.authorTavares, Carlos J.
dc.date.accessioned2025-01-09T15:15:44Z
dc.date.available2025-01-09T15:15:44Z
dc.date.issued2023-12-21
dc.description.abstractWide-field surface plasmon resonance microscope (WF-SPRM) based on polyethylene oxide/polyacrylic acid (PEO/PAA) polyelectrolyte brushes (PEBs) is presented for particle detection application. PEO acts as an H-bond acceptor, while PAA serves as an H-bond donor, forming hydrogen-bonding complexes within the brushes. Morphological, chemical, and crystal structural analyses confirm that the PEO/PAA brushes undergo a transition from a collapsed to a stretched state as the solvent pH is increased from 1 to 10. This pH-dependent change also renders the PEO/PAA brushes more hydrophilic. Additionally, the electrical conductivity and refractive index of the PEO/PAA brushes increase concomitantly with the increase of solvent pH. Furthermore, theoretical and experimental approaches study the sensitivity of WF-SPRM utilizing Au-(PEO/PAA) polyelectrolyte layers. The theoretical sensitivity of WF-SPRM is enhanced from 118.5 deg./RIU for the Au-layer to 178.1 deg./RIU for Au- (PEO/PAA PEBs). Moreover, the signal-to-noise ratio for the Au-(PEO/PAA PEBs) layer is 20 ± 1, indicating improved sensing performance compared to the Au-layer (signal-to-noise ratio of 6 ± 1). A mathematical model to describe the discrete particle detection by WF-SPRM is presented, where results demonstrate a good agreement between the calculated intensity profile and experimental data.en
dc.identifier.urihttp://hdl.handle.net/2003/43295
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-25127
dc.language.isoen
dc.relation.ispartofseriesApplied Surface Science; 649
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subjectSurface plasmon resonance (SPR)en
dc.subjectImaging wide-field SPR microscope (WF- SPRM)en
dc.subjectPolyelectrolyte brushes (PEBs)en
dc.subjectPolyacrylic acid (PAA)en
dc.subjectPolyethylene oxide (PEO)en
dc.subject.ddc530
dc.titleWide-field surface plasmon resonance microscope based on polyethylene oxide/polyacrylic acid brushesen
dc.typeText
dc.type.publicationtypeArticle
dcterms.accessRightsopen access
eldorado.secondarypublicationtrue
eldorado.secondarypublication.primarycitationAl-Bataineh, Q.M. et al. (2024) ‘Wide-field surface plasmon resonance microscope based on polyethylene oxide/polyacrylic acid brushes’, Applied surface science, 649. Available at: https://doi.org/10.1016/j.apsusc.2023.159189
eldorado.secondarypublication.primaryidentifierhttps://doi.org/10.1016/j.apsusc.2023.159189

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