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dc.contributor.authorDitzhaus, Marc-
dc.contributor.authorGaigall, Daniel-
dc.date.accessioned2023-06-27T05:28:21Z-
dc.date.available2023-06-27T05:28:21Z-
dc.date.issued2022-02-14-
dc.identifier.urihttp://hdl.handle.net/2003/41843-
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-23686-
dc.description.abstractThis paper considers a paired data framework and discusses the question of marginal homogeneity of bivariate high-dimensional or functional data. The related testing problem can be endowed into a more general setting for paired random variables taking values in a general Hilbert space. To address this problem, a Cramér–von-Mises type test statistic is applied and a bootstrap procedure is suggested to obtain critical values and finally a consistent test. The desired properties of a bootstrap test can be derived that are asymptotic exactness under the null hypothesis and consistency under alternatives. Simulations show the quality of the test in the finite sample case. A possible application is the comparison of two possibly dependent stock market returns based on functional data. The approach is demonstrated based on historical data for different stock market indices.en
dc.language.isoende
dc.relation.ispartofseriesTEST;31(3)-
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/de
dc.subjectMarginal homogeneityen
dc.subjectFunctional dataen
dc.subjectBootstrap testen
dc.subjectU-statisticen
dc.subjectCramér–von-Mises testen
dc.subjectStock market returnen
dc.subject.ddc310-
dc.titleTesting marginal homogeneity in Hilbert spaces with applications to stock market returnsen
dc.typeTextde
dc.type.publicationtypeArticlede
dcterms.accessRightsopen access-
eldorado.secondarypublicationtruede
eldorado.secondarypublication.primaryidentifierhttps://doi.org/10.1007/s11749-022-00802-5de
eldorado.secondarypublication.primarycitationDitzhaus, M., Gaigall, D. Testing marginal homogeneity in Hilbert spaces with applications to stock market returns. TEST 31, 749–770 (2022). https://doi.org/10.1007/s11749-022-00802-5de
Appears in Collections:Institut für Mathematische Statistik und industrielle Anwendungen

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