Transport and noise properties of AlGaN/GaN heterostructures for high-frequency applications
dc.contributor.advisor | Bayer, M. | |
dc.contributor.author | Kurakin, Andriy | |
dc.contributor.referee | Tolan, M. | |
dc.date.accepted | 2007-11-02 | |
dc.date.accessioned | 2008-01-21T10:24:29Z | |
dc.date.available | 2008-01-21T10:24:29Z | |
dc.date.issued | 2008-01-21T10:24:29Z | |
dc.identifier.uri | http://hdl.handle.net/2003/24955 | |
dc.identifier.uri | http://dx.doi.org/10.17877/DE290R-15751 | |
dc.identifier.urn | urn:nbn:de:hbz:290-2003/24955-0 | |
dc.language.iso | en | de |
dc.subject | III-nitrides | en |
dc.subject | Noise | en |
dc.subject | Low-temperature transport | en |
dc.subject | AlGaN/GaN-structure | en |
dc.subject | High Electron Mobility Transistor | en |
dc.subject | HEMT | de |
dc.subject | Resonant Tunneling Diode | en |
dc.subject | RTD | de |
dc.subject.ddc | 530 | |
dc.title | Transport and noise properties of AlGaN/GaN heterostructures for high-frequency applications | en |
dc.type | Text | de |
dc.type.publicationtype | doctoralThesis | de |
dcterms.accessRights | open access |