Trace analysis - gain insight through modelchecking and cycle reduction

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dc.contributor.authorKemper, Volker
dc.contributor.authorTepper, Carsten
dc.date.accessioned2007-06-13T15:51:15Z
dc.date.available2007-06-13T15:51:15Z
dc.date.issued2006-06-23
dc.identifier.issn1612-1376
dc.identifier.urihttp://hdl.handle.net/2003/24372
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-8119
dc.language.isoende
dc.publisherSFB 559de
dc.relation.ispartofseriesTechnical Report;06007en
dc.subject.ddc620
dc.titleTrace analysis - gain insight through modelchecking and cycle reductionen
dc.typeTextde
dc.type.publicationtypereport
dcterms.accessRightsopen access

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