Advanced analysis techniques for x-ray reflectivities

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dc.contributor.advisorTolan, M.
dc.contributor.advisorStolze, J.
dc.contributor.authorZimmermann, Klaus Martin
dc.date.accepted2005-07-11
dc.date.accessioned2006-04-13T12:47:05Z
dc.date.available2006-04-13T12:47:05Z
dc.date.issued2006-04-13T12:47:05Z
dc.format.extent9000031 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/2003/22288
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-26
dc.identifier.urnurn:nbn:de:hbz:290-2003/22288-8
dc.language.isoen
dc.subjectX-ray reflectivityen
dc.subjectSurfaceen
dc.subjectRöntgenstreuungde
dc.subjectOberflächede
dc.subjectNickel-Carbonde
dc.subjectTitanium-Carbonde
dc.subject.ddc530
dc.titleAdvanced analysis techniques for x-ray reflectivitiesen
dc.title.alternativetheory and applicationen
dc.typeTextde
dc.type.publicationtypedoctoralThesis
dcterms.accessRightsopen access

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