Advanced analysis techniques for x-ray reflectivities

dc.contributor.advisor	Tolan, M.
dc.contributor.advisor	Stolze, J.
dc.contributor.author	Zimmermann, Klaus Martin
dc.date.accepted	2005-07-11
dc.date.accessioned	2006-04-13T12:47:05Z
dc.date.available	2006-04-13T12:47:05Z
dc.date.issued	2006-04-13T12:47:05Z
dc.format.extent	9000031 bytes
dc.format.mimetype	application/pdf
dc.identifier.uri	http://hdl.handle.net/2003/22288
dc.identifier.uri	http://dx.doi.org/10.17877/DE290R-26
dc.identifier.urn	urn:nbn:de:hbz:290-2003/22288-8
dc.language.iso	en
dc.subject	X-ray reflectivity	en
dc.subject	Surface	en
dc.subject	Röntgenstreuung	de
dc.subject	Oberfläche	de
dc.subject	Nickel-Carbon	de
dc.subject	Titanium-Carbon	de
dc.subject.ddc	530
dc.title	Advanced analysis techniques for x-ray reflectivities	en
dc.title.alternative	theory and application	en
dc.type	Text	de
dc.type.publicationtype	doctoralThesis
dcterms.accessRights	open access
eldorado.dnb.deposit	true	de

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