Full metadata record
DC FieldValueLanguage
dc.contributor.authorVardeman, Stephen B.de
dc.contributor.authorWang, Lilyde
dc.contributor.authorWendelberger, Joanne R.de
dc.date.accessioned2004-12-06T18:41:35Z-
dc.date.available2004-12-06T18:41:35Z-
dc.date.issued2003de
dc.identifier.urihttp://hdl.handle.net/2003/5000-
dc.identifier.urihttp://dx.doi.org/10.17877/DE290R-15051-
dc.description.abstractWe consider problems of quantifying and monitoring accuracy and precision of measurement in mass spectrometry, particularly in contexts where there is unavoidable day-to-day/period-to-period changes in instrument sensitivity. First we consider the issue of estimating instrument sensitivity based on data from a typical calibration study. Simple method-of-moments methods, likelihood-based methods, and Bayes methods based on the one-way random effects model are illustrated. Then we consider subsequently assessing the precision of an estimate of a mole fraction of a gas of interest in an unknown. Finally, we turn to the problem of ongoing measurement process monitoring and illustrate appropriate set-up of Shewhart control charts in this application.en
dc.format.extent324515 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoende
dc.publisherUniversitätsbibliothek Dortmundde
dc.subject.ddc310de
dc.titleCalibration, Error Analysis, and Ongoing Measurement Process Monitoring for Mass Spectrometryde
dc.typeTextde
dc.type.publicationtypereporten
dcterms.accessRightsopen access-
Appears in Collections:Sonderforschungsbereich (SFB) 475

Files in This Item:
File Description SizeFormat 
tr38-03.pdfDNB316.91 kBAdobe PDFView/Open


This item is protected by original copyright



This item is protected by original copyright rightsstatements.org