Authors: Shevasuthisilp, Suntichai
Vardeman, Stephen B.
Title: Development Programs One-Shot Systems Using Multiple-State Design Reliability Models
Language (ISO): en
Abstract: Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change.
Subject Headings: development programs
one-shot systems
multiple-state design reliability test
redesign
optimal programs
dynamic programming
accelerated testing
URI: http://hdl.handle.net/2003/5010
http://dx.doi.org/10.17877/DE290R-15044
Issue Date: 2003
Publisher: Universitätsbibliothek Dortmund
Appears in Collections:Sonderforschungsbereich (SFB) 475

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