Authors: | Shevasuthisilp, Suntichai Vardeman, Stephen B. |
Title: | Development Programs One-Shot Systems Using Multiple-State Design Reliability Models |
Language (ISO): | en |
Abstract: | Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change. |
Subject Headings: | development programs one-shot systems multiple-state design reliability test redesign optimal programs dynamic programming accelerated testing |
URI: | http://hdl.handle.net/2003/5010 http://dx.doi.org/10.17877/DE290R-15044 |
Issue Date: | 2003 |
Provenance: | Universitätsbibliothek Dortmund |
Appears in Collections: | Sonderforschungsbereich (SFB) 475 |
Files in This Item:
File | Description | Size | Format | |
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tr43-03.pdf | DNB | 249.84 kB | Adobe PDF | View/Open |
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