Characterisation of ionisation induced surface effects for the optimisation of silicon detectors for particle physics applications

Loading...
Thumbnail Image

Date

2001-11-12

Journal Title

Journal ISSN

Volume Title

Publisher

Universität Dortmund

Alternative Title(s)

Abstract

Description

Table of contents

Keywords

silicon, detector, silicon radiation detector, radiation damage, Surface damage, Silizium, Strahlenschäden, Detektor

Subjects based on RSWK

Citation