Development Programs One-Shot Systems Using Multiple-State Design Reliability Models
dc.contributor.author | Shevasuthisilp, Suntichai | de |
dc.contributor.author | Vardeman, Stephen B. | de |
dc.date.accessioned | 2004-12-06T18:41:51Z | |
dc.date.available | 2004-12-06T18:41:51Z | |
dc.date.issued | 2003 | de |
dc.description.abstract | Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change. | en |
dc.format.extent | 255832 bytes | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/2003/5010 | |
dc.identifier.uri | http://dx.doi.org/10.17877/DE290R-15044 | |
dc.language.iso | en | de |
dc.publisher | Universitätsbibliothek Dortmund | de |
dc.subject | development programs | en |
dc.subject | one-shot systems | en |
dc.subject | multiple-state design reliability test | en |
dc.subject | redesign | en |
dc.subject | optimal programs | en |
dc.subject | dynamic programming | en |
dc.subject | accelerated testing | en |
dc.subject.ddc | 310 | de |
dc.title | Development Programs One-Shot Systems Using Multiple-State Design Reliability Models | en |
dc.type | Text | de |
dc.type.publicationtype | report | en |
dcterms.accessRights | open access |
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