Authors: Kemper, Volker
Tepper, Carsten
Title: Trace analysis - gain insight through modelchecking and cycle reduction
Language (ISO): en
URI: http://hdl.handle.net/2003/24372
http://dx.doi.org/10.17877/DE290R-8119
Issue Date: 2006-06-23
Publisher: SFB 559
Appears in Collections:Sonderforschungsbereich (SFB) 559

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