Authors: Kemper, Volker
Tepper, Carsten
Title: Trace analysis - gain insight through modelchecking and cycle reduction
Language (ISO): en
Issue Date: 2006-06-23
Provenance: SFB 559
Appears in Collections:Sonderforschungsbereich (SFB) 559

Files in This Item:
File Description SizeFormat 
Technical Report 06007.pdfDNB639.2 kBAdobe PDFView/Open

This item is protected by original copyright

All resources in the repository are protected by copyright.