Identification of outliers in exponential samples with stepwise procedures

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DC Field	Value	Language
dc.contributor.author	Pawlitschko, J.	de
dc.contributor.author	Schultze, V.	de
dc.date.accessioned	2004-12-06T18:44:24Z	-
dc.date.available	2004-12-06T18:44:24Z	-
dc.date.issued	2000	de
dc.identifier.uri	http://hdl.handle.net/2003/5085	-
dc.identifier.uri	http://dx.doi.org/10.17877/DE290R-15173	-
dc.description.abstract	In this paper we consider the problem of identifying outliers in exponential samples with stepwise procedures, namely inward and outward testing procedures. We treat outliers in the spirit of Davies and Gather (1993) as points which for given alpha > 0 lie in a certain alpha-outlier region and focus especially on the worst-case be-haviour of the identification rules. Best results yield stepwise procedures which use test statistics based on a standardized version of the sample median.	en
dc.format.extent	1156030 bytes	-
dc.format.extent	524156 bytes	-
dc.format.mimetype	application/pdf	-
dc.format.mimetype	application/postscript	-
dc.language.iso	en	de
dc.publisher	Universitätsbibliothek Dortmund	de
dc.subject	outlier identification	en
dc.subject	inward testing	en
dc.subject	outward testing	en
dc.subject	breakdown points	en
dc.subject	robust statistics	en
dc.subject.ddc	310	de
dc.title	Identification of outliers in exponential samples with stepwise procedures	en
dc.type	Text	de
dc.type.publicationtype	report	en
dcterms.accessRights	open access	-
Appears in Collections:	Sonderforschungsbereich (SFB) 475

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