Zuverlässigkeit von sub-µm-CMOS-Schaltungen bei Bias-Temperature-Stress (BTS)

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DC Field	Value	Language
dc.contributor.advisor	Goser, Karl	-
dc.contributor.author	Schlünder, Christian	-
dc.date.accessioned	2007-03-21T13:18:28Z	-
dc.date.available	2007-03-21T13:18:28Z	-
dc.date.issued	2007-03-21T13:18:28Z	-
dc.identifier.uri	http://hdl.handle.net/2003/24191	-
dc.identifier.uri	http://dx.doi.org/10.17877/DE290R-8410	-
dc.language.iso	de	de
dc.subject	Zuverlässigkeit	de
dc.subject	Bias Temperature Stress	en
dc.subject	BTS	de
dc.subject	NBTI	de
dc.subject	Degradation	en
dc.subject	MOSFET	de
dc.subject.ddc	620	-
dc.title	Zuverlässigkeit von sub-µm-CMOS-Schaltungen bei Bias-Temperature-Stress (BTS)	de
dc.type	Text	de
dc.contributor.referee	Oehm, Jürgen	-
dc.date.accepted	2006-09-12	-
dc.type.publicationtype	doctoralThesis	de
dc.identifier.urn	urn:nbn:de:hbz:290-2003/24191-8	-
dcterms.accessRights	open access	-
Appears in Collections:	Lehrstuhl für Bauelemente der Elektrotechnik

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Abstract Dissertation Chr_Schlünder.pdf		60.05 kB	Adobe PDF	View/Open
Dissertation.pdf	DNB	1.74 MB	Adobe PDF	View/Open

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