Authors: Schlünder, Christian
Title: Zuverlässigkeit von sub-µm-CMOS-Schaltungen bei Bias-Temperature-Stress (BTS)
Language (ISO): de
Subject Headings: Zuverlässigkeit
Bias Temperature Stress
BTS
NBTI
Degradation
MOSFET
URI: http://hdl.handle.net/2003/24191
http://dx.doi.org/10.17877/DE290R-8410
Issue Date: 2007-03-21T13:18:28Z
Appears in Collections:Lehrstuhl für Bauelemente der Elektrotechnik

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